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Please use this identifier to cite or link to this item: http://hdl.handle.net/123456789/1266

Title: The Low Temperature Resistivity Of Mn-Ni Films
Authors: Ampong, F. K.
Boakye, F.
Issue Date: 2011
Publisher: Nova Science Publishers
Abstract: Measurements on electrical resistivity of thermally evaporated Mn100-x Nix films (with x = 0.5, 1.5 and 2.5 at. %) have been carried out over the temperature range from 300 to 1.4 K using the van der Pauw four probe technique. The films were grown on a glass substrate held at a temperature of 300 K in an ambient pressure of 2 x l0-6 torr. All the films show the usual resistance minimum, a notable characteristic of α-Mn but their low temperature behavior reveal a tendency towards saturation of the resistivity as the temperature approaches zero. This saturation is reminiscent of the Kondo effect. Keywords: Mn Ni films, Electrical resistivity, Kondo effect.
Description: This article was published by Nova Science Publishers in 2011.
URI: http://hdl.handle.net/123456789/1266
Appears in Collections:College of Science

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