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|Title: ||Critical scattering of conduction electrons around the Niel temperature of a-manganese thin films|
|Authors: ||Boakye, F.|
Adanu, K. G.
Grassie, A. D. C.
|Issue Date: ||8-Sep-1994|
|Abstract: ||The critical scattering of conduction electrons in the neighbourhood of the Ned temperature of Mn thin films has been studied using our resistivity-temperature curves. The Mel temperature of a-Mn thin films has been established as 90± I K and an analysis of the resistivity results near the Mel temperature gave critical exponents which are in moderate agreement with existing theories.|
|Description: ||This article was published in 1994 by Elsevier Science Ltd.|
|Appears in Collections:||College of Science|
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