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Please use this identifier to cite or link to this item: http://hdl.handle.net/123456789/1245

Title: Electrical resistivity studies of thermally evaporated manganese-rhenium thin films
Authors: Boakye, F.
Issue Date: 8-Sep-2003
Abstract: Abstract Electrical resistivity studies have been carried out on thermally evaporated Mn1oo_,,Rex thin films (with X = 0.1-0.5 and I at.% Re) over the temperature range from 300 to 1.4 K using the van der Pauw four probe technique. A resistivity minimum a notable characteristic of α-Mn was found in all the specimens with a shift of Tm;,, corresponding to the resistivity minimum to upper values as the concentration of Re increases. The results show a tendency towards saturation of the resistivity as the temperature approaches zero implying a Kondo scattering mechanism in the samples. The shift of Tmin and the characteristic Kondo temperature TK to upper values may be explained in terms of the Kondo scattering. Keywords: Kondo scattering; Electrical resistivity; Thin films
Description: This article was published in 2003 by Elsevier Ltd.
URI: http://hdl.handle.net/123456789/1245
Appears in Collections:College of Science

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