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|Title: ||Effect of substrate temperatures on the electrical resistivity of thermally evaporated Mn thin films|
|Authors: ||Boakye, F.|
Ampong, F. K.
Abavare, E. K. K.
|Issue Date: ||8-Sep-2006|
|Abstract: ||Resistivity measurements have been performed on three samples of Mn thin films from 300 to 1.4 K using the van der Pauw four probe technique. The films were grown by thermal evaporation onto glass substrates held at 523, 323 and 77 K, respectively in a bell jar held at 6 x 10-6 Torr. The resistivity-temperature results of the three specimens reveal a variety of low temperature behaviours. A behaviour typical of the bulk a-Mn is obtained with the film grown at a substrate temperature of 523 K whilst with the film grown at a substrate temperature of 323 K, the resistivity tends to a saturation at low temperatures exhibiting a behaviour reminiscent of Kondo scattering. The resistivity-temperature behaviour of the sample held at a substrate temperature of 77 K may be regarded as typical of a metallic alloy glass with a negative temperature coefficient of resistivity at high temperatures and this turns to a T2 dependence of resistivity at very low temperatures.
Keywords: Manganese; Resistivity: Kondo scattering; Metallic-alloy-glass|
|Description: ||This article was published in 1997 by Elsevier Ltd.Also available at 10.1016/j.cryogenics.2006.11.001.|
|Appears in Collections:||College of Science|
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